The KLA Tencor P-2 Long Scan Profiler is a computerized, high-sensitivity surface profiler that measures roughness. • KLA Tencor P-2 Profilometer Manual (pdf). KLA Tencor P- 1. 5 Profilometer, University of Cincinnati. General Information. Equipment Name: KLA Tencor P- 1. ERCMax Wafer Size: 8. RIT Title: Tencor P2 Profilometer Semiconductor & Microsystems Fabrication Laboratory Revision: D Rev. Operation Instructions for the. KLA Tencor P-6 Surface Profilometer. For Training please contact Dave Heemstra – dheemstr@nd.edu.

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